Salem, NH, August 26th, 2020
Transmission electron microscopy (TEM) is a scientific technique used for imaging and analysis of structure and morphology at exceptionally high resolutions using an electron beam transmitted through a very small or thin prepared section of a sample. TEM creates images of samples at magnifications far surpassing the capabilities of optical microscopy, even down to atomic lattice line structure resolution.
TEM with energy-dispersive X-ray analysis (EDX), along with scanning electron microscopy (SEM) with EDX, provide direct observations of microstructural features on a surface, at an interface and inside of a bulk material. These precision techniques provide for the capture of extremely fine details and are widely used by material scientists and engineers for research and development, and to support manufacturing in everything from nanotechnologies and semiconductors to the aerospace and defense industries to name a few.
For example, TEM can be an excellent choice for crystalline defect analysis. Knowledge of crystalline defects is important in predicting behavior and finding failure mechanisms for metallic and electronic materials. Defects such as voids, stacking faults, dislocations and loops can be revealed and analyzed using weak beam dark imaging, trace analysis and other techniques. TEM analysis can also be used in applications such as nanoparticle size distribution, phase transitions, strengthening mechanisms in metallic and ceramic materials, structure of polymers, identification of precipitates and dispersive particles, thin film analysis and phase orientation relationships.
An even wider range of applications utilize SEM, partly because of the ease and less destructive nature of sample preparation. A few examples of SEM/EDX services include the identification of particles, fracture surface analysis, analysis of coatings, patterning and defect characterization of microelectronic devices, and elemental distribution analysis.
Advanced MicroAnalytical is a leading provider of TEM and SEM services. Their cutting-edge laboratory includes TEMs, SEMs, Focused Ion Beam (FIB) preparation of thin sections, precision ion polishing, cryo-ultramicrotome and many other advanced instruments and techniques. These technologies, coupled with Advanced MicroAnalytical expertise, enable their scientists and engineers to handle the most challenging projects for clients from across the globe.
To learn more about this or other material testing and support services provided by Advanced MicroAnalytical, please visit www.AdvancedMicroAnalytical.com, call (877) 605-6662 or email info@AdvancedMicroAnalytical.com.
About Advanced MicroAnalytical
At Advanced MicroAnalytical we are dedicated to providing you and your business with critical insight and knowledge that is essential in the modern era. We provide the testing services and analytical tools for comprehensive understanding of your materials and projects. Our services range from advanced microanalysis of nanotechnology to compositional and functional analysis of large manufactured systems. Our laboratory services span a wide range of industries, including manufacturing, micro-electronics, nanofabrication, aerospace and defense, environmental engineering – as well as many others. Advanced MicroAnalytical is committed to serving as a valued analytical partner to our clients. We offer unmatched analysis, testing, and services to assist you in your business, environmental, and research challenges. Visit our website at
www.advancedmicroanalytical.com.
MATERIALS SCIENCE AND FORENSIC SCIENCES LABORATORY
