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Advanced Materials Testing Laboratory

Category Press Release
Publish Date 6/10/2020
Author Paul Cochrane
Title Scanning Electron Microscopy from Advanced MicroAnalytical Provides Answers to Material Challenges and Environmental Investigations
Introduction Advanced MicroAnalytical provides precision material testing utilizing SEM and other advanced techniques to provide clients with images and solutions for development, production, environmental and failure analysis.

Salem, NH, June 10th, 2020

Scanning electron microscopy (SEM) is one of the most versatile and frequently used instrumentation techniques in modern materials science, microanalysis and investigative applications. SEM analysis provides detailed, high resolution imaging capabilities at a very wide range of magnifications, ranging from 10x to 1Mx magnification on diverse samples.

The technology works by generating an electron beam and then focusing, directing and rastering the beam across the surface of the sample. Electrons are either displaced or scattered from the material in the sample in a very limited area. Collecting these electrons allows for an image of the sample to be captured, showing the surface of the sample at a magnification controlled by the size of the scanned area. Since electrons are being used, the microscope can easily image features and materials that are smaller than the physical resolution limit of light, making the use of this tool for high magnification examination a natural fit.

Additionally, by examining the geometry and energy of scattering, and varying the accelerating voltage of the scanning beam, information about the material properties of the imaged sample can be obtained. The small spot size, precise control and unique material interactions allow for an SEM to be combined with a full spectrum of incorporated specialized detectors that do everything from chemical analysis, provide crystallographic data, or measure structural or optical properties of a sample.

While SEM is a standard staple of many physical sciences including metallurgy, ceramics, polymer science and petrography, the experienced scientific staff at Advanced MicroAnalytical utilizes this impressive analytical capability across many disciplines. Advanced MicroAnalytical is often called upon to use SEM to support research and development (R&D) or engineering failure analysis, for high specificity and customized environmental or indoor air quality (IAQ) analysis of samples, to perform forensic or comparative testing, or to design custom materials analysis testing protocols for specific industries.

The flexibility of SEM, as well as the dynamic, high depth of field images obtained with this analysis makes it a go-to method to gain structural insight on wide range of sample types. To learn more about this or other material testing and support services provided by Advanced MicroAnalytical, please visit, call (877) 605-6662 or email

About Advanced MicroAnalytical

At Advanced MicroAnalytical we are dedicated to providing you and your business with critical insight and knowledge that is essential in the modern era. We provide the testing services and analytical tools for comprehensive understanding of your materials and projects. Our services range from advanced microanalysis of nanotechnology to compositional and functional analysis of large manufactured systems.  Our laboratory services span a wide range of industries, including manufacturing, micro-electronics, nanofabrication, aerospace and defense, environmental engineering – as well as many others. Advanced MicroAnalytical is committed to serving as a valued analytical partner to our clients. We offer unmatched analysis, testing, and services to assist you in your business, environmental, and research challenges. Visit our website at
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