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Failure Analysis Testing Services

Category Press Release
Publish Date 6/19/2019
Author Paul Cochrane
Title Third Party Electronic and High Tech Product Inspection Services Create Lasting Positive Outcomes
Introduction Advanced MicroAnalytical offers independent third party electronic inspection and testing services along with prototyping solutions, failure analysis, non-destruction examinations, and other critical assessment and quality control services.

Salem, NH, June 19th, 2019

For manufacturers of high tech products and electronics it is critical to maintain the reputation and bottom line of the company. Costly returns and any complaints from clients will inevitably hurt profits and can cause a public relations nightmare.

Fortunately, there are solutions to prevent these types of scenarios from occurring. Independent third party inspection and testing services help electronic manufacturers avoid and detect defective products before they reach consumers when the right analyses are employed during production and prior to product shipping.

A leading provider of this specialized testing is Advanced MicroAnalytical. Their scientists and engineers offer comprehensive inspection services for the high tech manufacturing and electronics industries. Advanced MicroAnalytical is capable of bringing the full range of analysis methodologies available as industry standards, as well as providing deeply customized analysis packages and ongoing support services. To achieve this, Advanced MicroAnalytical offers a wide spectrum of non-destructive and destructive inspection methods that include Visual Inspection, X-Ray, 3D X-Ray CT, XRF, CSAM, SEM/EDS, Dye & Pry and more. These services help to verify composition, workmanship and potential internal failure modes, and can drAdvanced MicroAnalyticaltically reduce returns for defective products while addressing any potential non-compliance issues in the production process.

If non-compliance issues or defects are detected, Advanced MicroAnalytical also offers full DPA and device decapsulation/dissection. This allows for a higher level detail of solder bonds, wire assembly and component level internal quality. Advanced MicroAnalytical also provides surface analysis, sub-micron die inspection, and full sub-transistor FIB-SEM and TEM analysis for instances when an issue may appear on an individual die component. These services can limit defective and costly returns as well as disruptions to production.

Advanced MicroAnalytical works diligently to maintain the hard earned reputations of clients through a combination of standard inspections and customized verification services. To learn more about this or other material testing, inspection and engineering services provided by Advanced MicroAnalytical, please visit, call (877) 605-6662 or email

About Advanced MicroAnalytical
At Advanced MicroAnalytical we are dedicated to providing you and your business with critical insight and knowledge that is essential in the modern era. We provide the testing services and analytical tools for comprehensive understanding of your materials and projects. Our services range from advanced microanalysis of nanotechnology to compositional and functional analysis of large manufactured systems.  Our laboratory services span a wide range of industries, including manufacturing, micro-electronics, nanofabrication, aerospace and defense, environmental engineering – as well as many others. Advanced MicroAnalytical is committed to serving as a valued analytical partner to our clients. We offer unmatched analysis, testing, and services to assist you in your business, environmental, and research challenges. Visit our website at
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