LABConnect™ - Online Results & More

Tutorial | Create Account | Login

Specialized NanoMaterial/NanoParticle Testing

Category NanoMaterials
Publish Date 6/19/2018
Author Jeff Jacques
Title Advanced MicroAnalytical Specialized NanoMaterial/NanoParticle Testing Services
Introduction Nano-Particles and Nano-Materials present large challenges. Advanced MicroAnalytical provides special imaging and testing capabilities for the smallest of materials
SALEM, NH – Nanomaterials are steadily becoming a ubiquitous part of engineering, being used for everyday consumer electronics, advanced therapy drug delivery systems and more. The size and properties of these materials present unique opportunities for engineers seeking to create new products to push the boundaries of material, chemical, and electrical engineering. Special instrumentation and expertise is needed for the analysis of materials in the nanoscale. EMSL Analytical, Inc. works directly with process engineers and research and development teams to provide characterization solutions on a myriad of sample types.

“Nano-sized particles present a challenge for characterization simply due to their size range (1nm to 100nm), which necessitates the use of special imaging and testing techniques,” said Jeff Jacques, Business Development Manager, New England Region at Advanced MicroAnalytical, Inc. “These particles can even pose a potential health risk based on their size due to the ease of ingestions and absorption into the body. Our experience with these materials allows our scientists to anticipate concerns and challenges to get clients the best data on the most challenging types of materials.

Advanced MicroAnalytical is able to analyze nanomaterials using the following techniques:

  • High Resolution TEM with Energy Dispersive X-ray (EDS) and surface characterization in Scanning Transmission Electron Microscope (sTEM) imaging mode
  • Field Emission Scanning Electron Microscope (FE-SEM) with EDS and 3D Electron Backscatter Diffraction (EBSD)& (3D-EBSD)
  • CryoTEM and prep
  • Dual Beam Focused Ion Beam (FIB) sectional analysis for characterization and TEM thin section preparation
  • Particle Size Distribution Analysis
  • In (SEM) Scanning Electron Microscopy tensile techniques for nano wires

To learn more about nanomaterials testing services please contact Advanced MicroAnalytical's Jeff Jacques at (603) 685-3951 or email info@advancedmicroanalytical.com.  

Sorry, this function is disabled.