X-ray Fluorescence Spectrometry (XRF) provides elemental compositional analysis of bulk samples using a non-destructive elemental analysis technique. It can be used to analyze the elemental composition of liquids, solids and loose powders. XRF provides a combination of high accuracy, precision and brisk sample preparation that make it a preferred elemental analytical technique. The high range of sensitivity and typically non or minimally destructive analysis make XRF a highly useful tool for a wide variety of applications. Elements ranging in atomic number from Beryllium (Be) to Uranium (U) in the concentration range from 100 % down to the sub-parts per million (ppm)-level. With WD XRF (wavelength dispersive), available at Advanced MicroAnalytical there is greater resolution and less overlap between spectral bands crucial for elemental identification in complex samples.
Whether you are simply analyzing bulk properties of a single sample or need to track changes in composition for quality control or research and development, XRF can provide precise elemental data for materials. This analysis finds broad use within most manufacturing industries, ranging from aerospace & defense to geology, ceramics and pigments, and even pharmaceutical applications. Advanced MicroAnalytical can provide you with expert advice and analysis for your XRF needs and projects.