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Scanning Acoustic Microscopy (CSAM)

Scanning Acoustic Microscopy (CSAM) is a non-invasive technique used to non-destructively inspect for construction details, defects or the integrity of an optically opaque solid sample, component, material or structure.  The Acoustic Microscope can be utilized as an aid in failure analysis, research & development, QC, reliability or process control by identifying sub surface delamination, voids, cracks, bond lines or seal issues in various materials. Typical applications are microelectronics, encapsulated devices, bonded wafers and materials, lid seal and more. At Advanced MicroAnalytical we use CSAM in concert with other techniques and instrumentation to give us diagnostic flexibility and for use with project analysis on samples where minimally invasive or nondestructive techniques are required. 

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Industries

Inspection Services   Electronics & Semiconductors
Integrated Circuit Support   Aerospace & Defense
Failure Analysis   Manufacturing Support
Non-Destructive Testing (NDT)   Ceramics



 

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