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GD-OES (Depth Profiling)

GD-OES depth profiling is a surface analysis technique that provides the information about the distribution and concentration of elements along the depth from surface in a solid or multi-layer material. Such information is often critical in understanding and controlling of the surface or substrate properties of the material or products.   

Examples of GD-OES depth profiling analysis include the oxidation of the super-alloys, plating layer characterization on steels, characterization of multiple layers in semiconductor devices or materials.  

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