There are times when performing materials analysis requires the highest amount of sensitivity, and all other considerations are irrelevant. While sometimes a complete breakdown of the device or sample can give you the most information sometimes reducing the sample to component atoms isn’t a viable alternative. Frequently failures may only be present due to an interaction between components, but often it simply isn’t acceptable for the sample to be altered at all, let alone destroyed. Unique, one of a kind failures, prototypes (either from manufacturing, or for reverse engineering purposes) or samples that are likely to come under legal scrutiny are all examples of samples where any alteration is unacceptable.
For those clients that need to maintain the integrity of their device or sample, Advanced MicroAnalytical offers a variety of completely non-destructive analysis options. Examination of the exterior of samples can be undertaken using a number of micro-analysis methods, including optical microscopy, DIC, polarized reflectance microscopy, and SEM. This allows for features from mm to microns to be documented without destroying the sample. Even interior structures are capable of being examined, with realtime radiographic inspection services, micro-X-ray CT, and scanning acoustic microscopy, (CSAM). Using fluorescence, IR and Raman spectroscopy, organic features and details on the surface of the sample can be chemically analyzed, and a combination of XRF and EDS or Raman can highlight inorganic features.
Our experienced scientific staff expert in the use of our advanced instrumentation, are familiar with the concerns of clients when it comes to maintaining the sanctity of sample integrity. Our staff will keep you apprised of the results, maintain the contiguity of sample associated records, and return the sample to you in the same state it was submitted. When you work with Advanced MicroAnalytical, you can be sure we will help guide you to the appropriate techniques for your application, ensuring you get the best non-destructive data possible, and next stages of analysis should more disruptive techniques become necessary.
Our Materials Science Division offers the following NDT techniques and services
- Real Time Magnified X-ray imaging
- High Resolution X-ray film imaging
- X-ray CT (computational Tomography)
- CSAM (Scanning Acoustic Microscopy)
- Ultrasonic Flaw Detector
- Acoustic Digital Tap Hammer
- Portable XRF (Niton type analyzer)
- XRF (Plating thickness measurement)