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Materials Analysis & Characterization Lab Services

Materials analysis and characterization covers a vast array of processes and analytical techniques.  The techniques required for characterization are dependent upon the type of material, sample composition, condition, form, and maybe most importantly what information is required.  At Advanced MicroAnalytical Analytical, Inc. we listen to our clients and our experience will help ensure we know your process and material, so we can match the right technique and method to your project. The following is a partial list of instrumentation and techniques that are available at Advanced MicroAnalytical for materials analysis and characterization: 

  • Specialized Sample Preparation: FIB, Cryo-Microtome, etc.

Chemical Analysis

  • X-Ray Diffractometers (XRD)

  • X-ray Fluorescence Spectrometer (WD-XRF)

  • Fourier Transform Infrared Microscope; Micro FTIR (5 um spot resolution, reflected, transmitted, ATR, mapping, line profiles)

  • Gas Chromatographs (GC, ECD, FID, MS, MS/MS, NPD, High Resolution, Pyrolisis)

  • Carbon, Nitrogen, Sulfur, Hydrogen  Analyzers (combustion)

  • Inductively Coupled Plasma Spectrometer (ICP)

  • Inductively Coupled Plasma Spectrometer/ Mass Spectroscopy (ICP/MS)

  • Ion Chromatography (IC)

  • Liquid chromatography–mass spectrometry (LC-MS)

  • Liquid chromatography-quadrupole mass spectrometer (LC-MS/MS)

  • High Performance Liquid Chromatography (HPLC)/Diode Array/Fluorescence Detectors

  • High Performance Liquid Chromatography coupled with ICP-MS (metals speciation)

  • Mercury Analyzer

Thermal Analysis

  • Differential Scanning Calorimeter (DSC)

  • Thermo Gravimetric Analysis (TGA)

  • Differential Thermal Analysis (DTA) 

  • Dynamic Mechanical Analysis (DMA)


  • Real Time Magnified X-ray imaging

  • High Resolution X-ray film imaging

  • X-ray CT (computational Tomography)

  • CSAM (Scanning Acoustic Microscopy)

  • Portable XRF (Niton type analyzer)

  • XRF (Plating thickness measurement)

Additional Testing Capabilities

  • EDM machining

  • Cryo-Microtome

  • Environmental Chambers (various conditions)

  • Heat-treating Furnaces (RT to 1700C)

  • Zeta Potential Analyzer

  • Additional Tests (offsite or special arrangement)

  • Dual Beam FIB (focused ion beam) – Tons of applications

  • EBSD/EBSD mapping

  • Serial block tomography imaging (3D reconstruction down to nm scale of volume w/EDS/EBSD compositional analysis)

  • Tensile stage real-time analysis of strain/compression in SEM

  • X-Ray Photoelectron Spectroscopy (XPS) 

  • TEM sample preparation and lift out

  • High Resolution TEM analysis (200KV + and cryoTEM)

  • Surface Profile/3D reconstruction

  • Micro Raman (small areas, diamonds, graphene, ceramics)

  • Atomic Force Microscopy (AFM) 

Related Techniques
EDS/Elemental Mapping
Hardness/Micro-hardness Testing
Particle Size Distribution Test
Surface Analysis & Profilometry
XPS - X-ray Photoelectron Spectroscopy
X-ray Imaging/3D X-Ray CT

Related Industries
Aerospace & Defense
Electronics & Semiconductor
Manufacturing Support
Medical Devices
Metals Industry
Paint, Printing & Coatings
Water Filtration & Membrane Technologies
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